• 2018 International Conference on Advanced Mechanical and Electrical Engineering (AMEE)

    December 26-28, 2018 | Beijing, China

  • 2018年高级机电工程国际会议

    12月26-28日 中国北京

Keynote Speakers



Prof. Xiaoqing Wen
(Fellow of IEEE)
Kyushu Institute of Technology, Japan


Biography: Xiaoqing WEN (wen@cse.kyutech.ac.jp) received a B.E. degree from Tsinghua University, China, in 1986, a M.E. degree from Hiroshima University, Japan, in 1990, and a Ph.D. degree from Osaka University, Japan, in 1993. From 1993 to 1997, he was a Lecturer at Akita University, Japan. He was a Visiting Researcher at University of Wisconsin, Madison, USA, from October 1995 to March 1996. He worked at SynTest Technologies, Inc., USA, from 1998 to 2003 and served as its Vice President and Chief Technology Officer. In 2004, he joined Kyushu Institute of Technology, Japan, where he is currently a Professor and Chair of Department of Creative Informatics. He is a Co-Founder/Co-Chair of the Technical Activity Committee on Power-Aware Testing under the Test Technology Technical Council of the IEEE Computer Society. He is serving as Associate Editors for IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems as well as IEEE Transactions on Very Large Scale Integration Systems. He co-authored and co-edited two widely-referred books: “VLSI Test Principles and Architectures: Design for Testability” and “Power-Aware Testing and Test Strategies for Low Power Devices”. His research interests include design, test, and diagnosis of VLSI circuits. He holds 43 U.S. Patents and 14 Japan Patents. He received the 2008 Society Best Paper Award from the Information Systems Society of Institute of Electronics, Information and Communication Engineers for his pioneering work on mitigating capture power in at-speed scan testing of low-power VLSI circuits. He was elevated to a Fellow of IEEE in 2012 for contributions to testing of integrated circuits. (Homepage: http://aries3a.cse.kyutech.ac.jp/~wen/)


Speech Title: LSI Testing: A Core Technology to a Successful Semiconductor Industry


Abstract: The semiconductor industry is exposed to shrinking feature sizes, growing circuit complexity, increasing clock speeds, and decreasing power supply voltages. In addition to significant impact on LSI design and manufacturing, these factors also have a profound impact on LST testing, a complex process for separating defective chips from defect-free ones. The major challenges to LSI testing are low test quality, high test cost, and excessive test power. These challenges have led to new chances of innovations in LSI testing, characterized by cell-aware test generation, test compression, and power-aware testing. This talk will review these challenges and chances. Furthermore, this talk will reveal the role of LSI testing in the semiconductor business chain, so as to explain why LSI testing is a core technology to a successful semiconductor industry.

Prof. Beom Hee Lee
(Fellow of IEEE & ICROS)
Seoul National University, South Korea


Biography: Professor Beom Hee Lee received his B.S. and M.S. degrees in Electronics Engineering from Seoul National University, Seoul, Korea in 1978 and 1980, respectively, and his Ph.D. degree in Computer, Information, and Control Engineering from the University of Michigan, Ann Arbor, Michigan, USA in 1985. From 1985 to 1987, he was with the School of Electrical Engineering at Purdue University, West Lafayette, IN, USA, as an Assistant Professor. He joined Seoul National University (SNU) in 1987, where he is currently a Professor at the Department of Electrical and Computer Engineering and the Director of the Robotics and Intelligent Systems Lab at SNU. In 2001, he was the Program Chairman of the IEEE International Conference on Robotics and Automation (ICRA) in Seoul, Korea. Since 2004, he has been a Fellow of the IEEE Robotics and Automation Society, and he is in charge of IEEE Robotics and Automation Korea Chapter as the chairman since 1995. He was the President of the Automation and Systems Research Institute (ASRI) in SNU during 2004-2006, and the Dean of Information Technology in SNU. He has served the Korea Robotics Society (KROS) as the president in 2009. He was also in charge of the Board of Directors of the Korea Institute of Patent Information (KIPI) as the chairman. He has published over 670 technical journal and conference papers mainly in the field of Robotics and Automation. His current interest includes multi-robot systems and applications, Multi-robot collision avoidance, Multi-robot SLAM problems and Underwater robotics.


Speech Title: Multi-Robot Collision Avoidance and Applications


Abstract: Nowadays, multi-robot operations are acknowledged as a common practice in industry for various tasks. State of the Art of Multi-Robot Systems are described in the first statement. Multi-robot research issues are then discussed in terms of the operational strategies: centralized, distributed, and mixed operational schemes. Next, we show that one of the main issues in multi-robot operation is the problem of collision avoidance. We also show the importance of the collision avoidance problem in multi-robot operations. For multi-robot collision avoidance, a special tool, called the collision map, is introduced and applied to the problem of multi-robot collision avoidance.
More deep analysis and investigation are presented for an application of the collision map. Various types of collision maps are then introduced with several possible applications. Also, robot path modification is viewed in terms of collision avoidance using the concept of collision map. Various applications using the collision map are presented for a problem of 100 multi-robot operations, a stealth intruder intercept scheme, and efficient multiple cleaning robots operation. Especially, the load balancing in multiple cleaning robots are realized using the collision map. Finally, future applications using multi-robot systems are briefly discussed.

Prof. Yifei Chen
China Agricultural University, China


Biography: He was born in Beijing, China. He received the B.S.E.E. degree from Dept. of Electrical Engineering of Beijing Agricultural Mechanization College in 1984, and the M.Phil (S. of Mang.) degrees in management engineering and applied science from Bei Hang University in 1991, the M.S. degree in control theory and control engineering from Beijing Agricultural Engineering University in 1994. Since graduation in 1984, he still works as the researcher and teacher in collage of Electronic & Electrical Power Eng. of Beijing Agricultural Engineering University which was renamed as China Agriculture University later. After holding the position in the university, he studied further in control theory class by IFCA in Tongji University at Shang Hai in 1995, where he currently holds the academic positions in research. In 1998, he is as associate Professor at College of Information and Electrical Engineering in China Agriculture University.

Prof. Yifei Chen has published extensively in control systems, control engineering, and mechanical control, including 3 books, 4 edited volumes, over 80 journal articles and book chapters, and over 30 international conference publications. He is currently the Editor-in-Chief of IJCCE, and member of editorial and advisory boards of several domestic journals in control, networks, and applied agricultural control engineering. He is a senior member of China Agricultural Engineering Association, a member of China Intelligent Automation Committee as well as a member of IEEE.

Prof. Yifei Chen has received several awards and recognitions over the years, among which are the Outstanding Paper Award of Chinese Science and Technology Association of China (2008); Outstanding Paper Award in ICINIS (2009), and Post Paper and Lecture Prize (2011) of WEC2011 Society (UN) in Switzerland; Outstanding Teacher Award (2005/2010) of China Agriculture University; Outstanding post graduation Director Award (2008/2009/2010/2012/2013)of China Agriculture University; Honorary Director Award for M.S. outstanding paper (2010) of China Agriculture University.